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Dr. Kars Troost
Senior Product Manager Business Line EUV ASML |
| Education: | |
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• PhD Solid State Physics, University of Utrecht, The Netherlands |
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| Experiences: | |
| • Senior Product Manager ASML • Product Manager FEI Company • Manager Philips Electron Optics • Scientist Philips Research |
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| Biography: | |
| Kars Troost, after completing his PhD in Solid State Physics at the University of Utrecht in 1990, joined Philips Research to work on magnetic immersion lenses for scanning electron microscopy (SEM). After joining Philips Electron Optics, now part of FEI, in 1994 he fulfilled various roles in the design and product management of wafer-based defect analysis tools now in use at major semiconductor companies. After transitioning to ASML in 2002, he has been active as senior product manager for a number of scanner types. Since 2011, he has been involved in the product management of various EUV scanners and scanner enhancements for EUV, as well as in bringing the first NXE:3300B scanners to use at a major customer site in Taiwan. Recently, he is focusing on the longer-term (> 2018) roadmap for EUV scanner and source products. |
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